TTCN-3 Bibliography

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A. Pietschker, "Automating Test Automation," ETSI TTCN-3 User Conference 2006: Berlin (Germany), May 31-June 2, 2006. 
Added by: Deleted user (09 Jul 2008 11:13:46 Europe/Berlin)   Last edited by: Deleted user (13 Aug 2008 14:24:11 Europe/Berlin)
Resource type: Conference Paper
BibTeX citation key: Pietschker
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Categories: General
Creators: Pietschker
Publisher: Fraunhofer FOKUS, ETSI (Berlin (Germany))
Collection: ETSI TTCN-3 User Conference 2006
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When trying to introduce TTCN-3 and thus improving test automation we are regularly faced with the issue of legacy test automation. These existing approaches to test automation range from small code developed for a very specific task to large application with substantial development effort or even purchased solution from third party vendors that might include hardware components. Often these solutions cater for a specific need and their combined appilcation is controlled by humans.

A higher degree of test automation can be achieved if these solutions are combined in a test system to enable overnight runs for example. TTCN-3 can be a good choice for implementing a future-oriented solution. However recreating all of the existing parts in TTCN-3 might not be a feasible solution from a business perspective. So instead of refraining from creating an advanced solution, the idea is to use those existing parts to substantially reduce the effort necessary to introduce an improved test automation solution.

In this presentation we will report on the successful integration of legacy test solutions using TTCN-3 and creating a new, advanced test system that enables overnight test runs. The presentation will illustrate our challenges and experiences from this project.
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