TTCN-3 Bibliography

WIKINDX Resources

T. Happonen, "TTCN3 applicability to remote embedded testing of electronics," ETSI TTCN-3 User Conference 2008: Madrid (Spain), June 3-6, 2008. 
Added by: Deleted user (22 Aug 2008 10:39:36 Europe/Berlin)   Last edited by: Deleted user (22 Aug 2008 11:35:49 Europe/Berlin)
Resource type: Conference Paper
BibTeX citation key: Happonena
View all bibliographic details
Categories: General
Creators: Happonen
Publisher: MTP, ETSI (Madrid (Spain))
Collection: ETSI TTCN-3 User Conference 2008
Views: 10/1082
Views index: %
Popularity index: 1%
   URLs   http://www.mtp.es/TTCN3UC2008/home.html#
Abstract
The proposed presentation aims to evaluate the applicability of TTCN-3 for remote embedded testing of electronics purposes. The presentation is based on experiences to implement a generally applicable test communication procedure by TTCN-3. The presentation conforms the following guidelines.
•In introduction section our approach to remote embedded testing is presented and a solution to generally applicable test communication procedure (UTCS, Universal Test Communication Standard) is introduced. This solution is intended to be used as an interface in remote controlled embedded testing.
•Theoretical part is used to relate UTCS capabilities into existing specifications (for example TCI, TTCN-3 Control Interface).
•Empirical part describes the experiences in implementing UTCS accordant test communication by TTCN-3 and illustrates the achieved results.
•Discussion section finally evaluates and comes to conclusions regarding the applicability of TTCN-3 to remote embedded testing based on a chosen approach.
Added by: Deleted user  
wikindx 5.2.1 ©2017 | Total resources: 340 | Username: -- | Bibliography: WIKINDX Master Bibliography | Style: Institute of Electrical and Electronics Engineers (IEEE) | Database queries: 45 | DB execution: 0.01928 secs | Script execution: 0.02787 secs