TTCN-3 Bibliography

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J. Wu, J. Wu, L. Xu, and C. Liu, "Test Design Recovery through Reverse Engineering," ETSI TTCN-3 User Conference 2007 Asia: Tutorial at the TTCN-3 User Confernce 2007, Beijing (China), Oct. 29-30, 2007. 
Added by: Deleted user (06 Aug 2008 14:22:40 Europe/Berlin)   Last edited by: Deleted user (15 Oct 2008 14:56:44 Europe/Berlin)
Resource type: Conference Paper
BibTeX citation key: Wu
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Categories: General
Creators: Liu, Wu, Xu
Publisher: organised by Beihang University, ETSI (Tutorial at the TTCN-3 User Confernce 2007, Beijing (China))
Collection: ETSI TTCN-3 User Conference 2007 Asia
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Popularity index: 1.25%
  
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