TTCN-3 Bibliography

WIKINDX Resources

C. White, "Experiences of design based testing with TTCN-3: Motivation, Configuration, and Results," ETSI TTCN-3 User Conference 2006: Berlin (Germany), May 31-June 2, 2006. 
Added by: Deleted user (07 Jul 2008 11:34:21 Europe/Berlin)   Last edited by: Deleted user (13 Aug 2008 14:17:39 Europe/Berlin)
Resource type: Conference Paper
BibTeX citation key: Whitea
View all bibliographic details
Categories: General
Creators: White
Publisher: Fraunhofer FOKUS, ETSI (Berlin (Germany))
Collection: ETSI TTCN-3 User Conference 2006
Views: 9/1809
Views index: %
Popularity index: 2.25%
   URLs   http://www.fokus.fraunhofer.de/en/fokus_events/motion/t3uc/index.html
Abstract
Within an Ericsson design team of the GSM Base Station Controller, a need arose to improve the reliability and quality of the design based testing whilst also reducing the cost of maintaining an own test framework. A TTCN-3 based solution was piloted and subsequently deployed to all design components. TTCN-3 was chosen for the potential performance, scalability and support for code centric style of testing. A key requirement was to re-use the message types between the product and the test product. Additionally short build times were essential. Another key requirement for deployment was integration with the build system. Integration with run-time analysis tools then followed with focus on code coverage. This paper presents how TTCN-3 was used to improve the design based test environment with integration to the build system and run-time analysis tools. It also presents the performance metrics of the subsequent round-trip build process and where further likely improvements can come from a continuous quality improvement process. The paper also detail the positive and negative experiences gained in the pilot project.
Added by: Deleted user  Last edited by: Deleted user
wikindx 5.2.1 ©2017 | Total resources: 348 | Username: -- | Bibliography: WIKINDX Master Bibliography | Style: Institute of Electrical and Electronics Engineers (IEEE) | Database queries: 45 | DB execution: 0.02082 secs | Script execution: 0.02734 secs