TTCN-3 Bibliography

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Rennoch, A. 2016, April 10, Test system architectures using advanced standardized test languages. Unpublished paper presented at 3rd International Workshop on Software Test Architecture. 
Added by: Axel Rennoch (4/18/16, 3:06 PM)   
Resource type: Conference Paper
BibTeX citation key: Rennoch2016
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Categories: General
Keywords: model-based testing, TDL, Test architecture, Test design, test specification, TTCN-3, UTP
Creators: Rennoch
Collection: 3rd International Workshop on Software Test Architecture
Views: 5/1100
The development of test suites using standardized test languages like TTCN-3 and UTP starts with an analysis of the external interfaces towards the system under test (SUT). Large and complex SUTs often require a distributed test system architecture that have to consider the test objectives and the introduction of multiple parallel test system components. The decomposition of a test system needs to be discussed and decided at the very beginning of the test development process. This presentation introduces different approaches from industrial test suite development projects and provides experiences with abstract test system architecture issues (e.g. synchronization, logging and maintenance).
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