TTCN-3 Bibliography

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T. Happonen, "TTCN3 applicability to remote embedded testing of electronics," ETSI TTCN-3 User Conference 2008: Madrid (Spain), June 3-6, 2008. 
Added by: Deleted user (22 Aug 2008 10:39:36 Europe/Berlin)   Last edited by: Deleted user (22 Aug 2008 11:35:49 Europe/Berlin)
Resource type: Conference Paper
BibTeX citation key: Happonena
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Categories: General
Creators: Happonen
Publisher: MTP, ETSI (Madrid (Spain))
Collection: ETSI TTCN-3 User Conference 2008
Views: 28/2006
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Popularity index: 2.75%
The proposed presentation aims to evaluate the applicability of TTCN-3 for remote embedded testing of electronics purposes. The presentation is based on experiences to implement a generally applicable test communication procedure by TTCN-3. The presentation conforms the following guidelines.
•In introduction section our approach to remote embedded testing is presented and a solution to generally applicable test communication procedure (UTCS, Universal Test Communication Standard) is introduced. This solution is intended to be used as an interface in remote controlled embedded testing.
•Theoretical part is used to relate UTCS capabilities into existing specifications (for example TCI, TTCN-3 Control Interface).
•Empirical part describes the experiences in implementing UTCS accordant test communication by TTCN-3 and illustrates the achieved results.
•Discussion section finally evaluates and comes to conclusions regarding the applicability of TTCN-3 to remote embedded testing based on a chosen approach.
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