TTCN-3 Bibliography

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E. Gaudin, "Automatic test generation based on functional coverage," ETSI User Conference on Advanced Automated Testing (2014): Munich, Germany, Sept. 16-18, 2014.  
Added by: Axel Rennoch 19 Sep 2014 11:54:30 Europe/Berlin
N. M. T. Nguyen, "Test case generation for Symbolic Distributed System Models: Application to Trickle based IoT Protocol," Ph.D. Thesis, Université Paris-Saclay, Paris, 2019.  
Last edited by: TET group 13 Jul 2020 13:51:22 Europe/Berlin
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