TTCN-3 Bibliography

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Displaying 1 - 25 of 25 (Bibliography: WIKINDX Master Bibliography)
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E. Bringmann, J. Grossmann, and I. Schieferdecker, "Continuous TTCN-3: Testing for Embedded Control Systems," ETSI TTCN-3 User Conference 2006: Berlin (Germany), May 31-June 2, 2006.  
Last edited by: SQC Admin 10 Oct 2008 12:39:52 Europe/Berlin
J. Grabowski, H. Neukirchen, I. Schieferdecker, D. Vega, and B. Zeiss, "An ISO 9126-based Quality Model to Assess the Quality of TTCN-3 Test Specifications," ETSI TTCN-3 User Conference 2007: Stockholm (Sweden), May 29-June 1, 2007.  
Last edited by: Deleted user 02 Apr 2009 11:47:27 Europe/Berlin
J. Grabowski, I. Schieferdecker, and A. Ulrich, "History, status, and recent trends of the testing and test control notation version 3 (TTCN-3)," Software Tools for Technology Transfer (STTT) 2014, vol. 2014, pp. 215–225, June 2014.  
Last edited by: Axel Rennoch 18 Jul 2014 15:40:22 Europe/Berlin
J. Grossmann and I. Schieferdecker, "Mapping AUTOSAR Interfaces to TTCN-3," ETSI TTCN-3 User Conference 2009: Sophia Antipolis (France), June 3-5, 2009.  
Added by: Axel Rennoch 05 Apr 2013 23:23:14 Europe/Berlin
A. Rennoch, C. Desroches, T. Vassiliou-Gioles, and I. Schieferdecker, TTCN-3 Quick Reference Card: For TTCN-3 multipart standard and extensions. 2010.  
Last edited by: Axel Rennoch 17 Jun 2015 17:38:08 Europe/Berlin
I. Schieferdecker, "A TTCN-3 based Test Automation Framework for HL7-based Applications and Components," Conference on Quality Engineering in Software Technology (Conquest) 2008: Potsdam (Germany), Sept. 24-26, 2008.  
Added by: Deleted user 19 Nov 2008 14:17:16 Europe/Berlin
I. Schieferdecker, A. Wiles, and A. Pietschker, "Introduction to the Certificate Exam," ETSI TTCN-3 User Conference 2007: Stockholm (Sweden), May 29-June 1, 2007.  
Last edited by: Deleted user 13 Aug 2008 14:51:26 Europe/Berlin
I. Schieferdecker and J. Grabowski, "Introduction to the special section on advances in test automation: The evolution of TTCN-3," Software Tools for Technology Transfer  (STTT) 2008, vol. 10, iss. 4, pp. 281–283, Aug. 2008.  
Last edited by: Deleted user 13 Aug 2008 15:10:02 Europe/Berlin
I. Schieferdecker, S. Kretzschmann, A. Rennoch, and M. Wagner, "IoT-testware - an eclipse project," in Proc. IEEE International Conference on Software Quality, Reliability and Security, Los Alamitos, Calif. July 25-29, 2017,  
Added by: TET group 02 Sep 2017 07:52:16 Europe/Berlin
I. Schieferdecker and T. Vassiliou-Gioles, "Realizing Distributed TTCN-3 Test Systems with TCI," in Testing of Communicating Systems (Testcom) 2003ser. Lecture Notes in Computer Science, Berlin Heidelberg: Springer-Verlag, 2003,  
Last edited by: Deleted user 22 Oct 2008 14:32:20 Europe/Berlin
I. Schieferdecker. 2008, Oct. 9 Testautomatisierung leicht gemacht. [Online]. Available: http://www.sigs.de/publ ... ecker_OS_testing_08.pdf  
Last edited by: Deleted user 10 Dec 2008 11:10:06 Europe/Berlin
I. Schieferdecker and J. Grossmann, "Testing hybrid control systems with TTCN-3: An overview on continuous TTCN-3," Software Tools for Technology Transfer  (STTT) 2008, vol. 10, iss. 4, pp. 383–400, Aug. 2008.  
Last edited by: Deleted user 13 Aug 2008 15:12:17 Europe/Berlin
I. Schieferdecker and J. Grabowski, "The Graphical Format of TTCN-3 in the Context of MSC and UML ," in Telecommunications and beyond: The Broader Applicability of SDL and MSC. 2002ser. Lecture Notes in Computer Science, E. Sherratt, Ed.Berlin Heidelberg: Springer-Verlag, 2002, pp. 233–252.  
Added by: Deleted user 22 Oct 2008 12:23:26 Europe/Berlin
I. Schieferdecker, "The TEMEA project," ETSI TTCN-3 User Conference 2008: Madrid (Spain), June 3-6, 2008.  
Added by: Deleted user 22 Aug 2008 11:23:18 Europe/Berlin
I. Schieferdecker, J. Grabowski, T. Vassiliou-Gioles, and G. Din, "The Test Technology TTCN-3," in Formal Methods and Testing, LNCS 20081st ed., Berlin Heidelberg: Springer-Verlag, 2008, pp. 292–319.  
Last edited by: Deleted user 13 Aug 2008 15:05:43 Europe/Berlin
I. Schieferdecker, H. Eichler, Z. R. Dai, M. Li, and W. Kroll, "The TTCN-3 Metamodel: A basis for Tool integration," ETSI TTCN-3 User Conference 2005: Sophia Antipolis (France), June 6-8, 2005.  
Last edited by: Deleted user 13 Aug 2008 14:13:09 Europe/Berlin
I. Schieferdecker, Z. R. Dai, J. Grabowski, and A. Rennoch, "The UML 2.0 Testing Profile and Its Relation to TTCN-3," in Testing of Communicating Systems (Testcom) 2003ser. Lecture Notes in Computer Science, Berlin Heidelberg: Springer-Verlag, 2003,  
Last edited by: Deleted user 22 Oct 2008 14:33:59 Europe/Berlin
I. Schieferdecker and J. Grabowski, "The UML Testing Profile," ETSI TTCN-3 User Conference 2004: Sophia Antipolis (France), May 3-5, 2004.  
Last edited by: Deleted user 13 Aug 2008 12:09:49 Europe/Berlin
I. Schieferdecker, A. Pietschker, and A. Wiles, "TTCN-3 Certified Tester," ETSI TTCN-3 User Conference 2004: Sophia Antipolis (France), May 3-5, 2004.  
Last edited by: Deleted user 13 Aug 2008 12:29:37 Europe/Berlin
I. Schieferdecker, "TTCN-3 in the testing universe," ETSI TTCN-3 User Conference 2008: Madrid (Spain), June 3-6, 2008.  
Added by: Deleted user 20 Aug 2008 14:59:19 Europe/Berlin
I. Schieferdecker, G. Réthy, and B. Zeiss, "TTCN-3 Language Maintenance and Status," ETSI TTCN-3 User Conference 2010:  
Added by: Axel Rennoch 25 Dec 2012 23:41:29 Europe/Berlin
I. Schieferdecker, "TTCN-3 technology as a candidate of unified test," ETSI TTCN-3 User Conference 2008: Madrid (Spain), June 3-6, 2008.  
Added by: Deleted user 22 Aug 2008 10:36:34 Europe/Berlin
I. Schieferdecker, D. Vega, and G. Din, "A TTCN-3 test automation framework for HL7/IHE based applications," ETSI TTCN-3 User Conference 2009: Sophia Antipolis (France), June 3-5, 2009.  
Added by: Axel Rennoch 05 Apr 2013 23:19:13 Europe/Berlin
D. Vega, I. Schieferdecker, and G. Din, "Test Data Variance as a Test Quality Measure: Exemplified for TTCN-3," in Proc. Testing of Communication Systems (Testcom/Fates/Forte) 2007, ser. Lecture Notes in Computer Science, vol. 4581/2007, Tallinn (Estonia), June 26-29, 2007, pp. 351–364.  
Added by: Deleted user 02 Apr 2009 13:48:49 Europe/Berlin
A. Vouffo-Feudjio and I. Schieferdecker, "Pattern-based development of TTCN-3 test suites," ETSI TTCN-3 User Conference 2007: Stockholm (Sweden), May 29-June 1, 2007.  
Last edited by: Deleted user 20 Aug 2008 11:57:14 Europe/Berlin
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