| Din, G. 2004, May 3–5, The XML to TTCN-3 Mapping. Unpublished paper presented at ETSI TTCN-3 User Conference 2004, Sophia Antipolis (France). |
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| Last edited by: Deleted user 8/13/08, 12:28 PM |
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| Din, G. 2008, June 3–6, A TTCN3 based Benchmark for BPEL Engines. Unpublished paper presented at ETSI TTCN-3 User Conference 2008, Madrid (Spain). |
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| Last edited by: Deleted user 9/17/08, 3:50 PM |
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| Din, G. (2008). An IMS Performance Benchmark Implementation based on the TTCN-3 Language. Software Tools for Technology Transfer (STTT) 2008, 10(4), 359–370. |
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| Last edited by: Deleted user 8/13/08, 3:06 PM |
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| Din, G. 2008, June 3–July 6, Performance testing/benchmarking with ttcn-3. Unpublished paper presented at ETSI TTCN-3 User Conference 2008, Madrid (Spain). |
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| Last edited by: Deleted user 1/9/13, 4:56 PM |
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| Din, G., & Rentea, C. 2006, May 31–June 2, Using TTCN-3 to Design Performance Tests. Unpublished paper presented at ETSI TTCN-3 User Conference 2006, Berlin (Germany). |
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| Last edited by: Deleted user 8/13/08, 2:26 PM |
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| Din, G., Vega, D., Petre, R., & Hoffmann, A. 2007, May 31–June 1, TTCN-3 based Implementation of ETSI TISPAN IMS Benchmark. Unpublished paper presented at ETSI TTCN-3 User Conference 2007, Stockholm (Sweden). |
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| Last edited by: Deleted user 8/20/08, 11:34 AM |
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| Schieferdecker, I., Grabowski, J., Vassiliou-Gioles, T., & Din, G. (2008). The Test Technology TTCN-3. In Formal Methods and Testing, LNCS 2008 1st ed. (pp. 292–319). Berlin Heidelberg: Springer-Verlag. |
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| Last edited by: Deleted user 8/13/08, 3:05 PM |
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| Schieferdecker, I., Vega, D., & Din, G. 2009, June 3–5, A ttcn-3 test automation framework for hl7/ihe based applications. Unpublished paper presented at ETSI TTCN-3 User Conference 2009, Sophia Antipolis (France). |
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| Added by: Axel Rennoch 4/5/13, 11:19 PM |
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| Vega, D., Din, G., & Rentea, C. 2006, May 31–June 2, Towards Quality Evaluation of TTCN-3 Tests. Unpublished paper presented at ETSI TTCN-3 User Conference 2006, Berlin (Germany). |
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| Last edited by: Deleted user 8/13/08, 2:20 PM |
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| Vega, D., Schieferdecker, I., & Din, G. 2007, June 26–29, Test Data Variance as a Test Quality Measure: Exemplified for TTCN-3. Paper presented at Testing of Communication Systems (Testcom/Fates/Forte) 2007, Berlin Heidelberg. |
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| Added by: Deleted user 4/2/09, 1:48 PM |
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