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G. Din, D. Vega, R. Petre, and A. Hoffmann, "TTCN-3 based Implementation of ETSI TISPAN IMS Benchmark," ETSI TTCN-3 User Conference
: Stockholm (Sweden), May 31-June 1, 2007.
Last edited by: Deleted user 20 Aug 2008 11:34:54 Europe/Berlin
J. Grabowski, H. Neukirchen, I. Schieferdecker, D. Vega, and B. Zeiss, "An ISO 9126-based Quality Model to Assess the Quality of TTCN-3 Test Specifications," ETSI TTCN-3 User Conference
: Stockholm (Sweden), May 29-June 1, 2007.
Last edited by: Deleted user 02 Apr 2009 11:47:27 Europe/Berlin
I. Schieferdecker, D. Vega, and G. Din, "A TTCN-3 test automation framework for HL7/IHE based applications," ETSI TTCN-3 User Conference
: Sophia Antipolis (France), June 3-5, 2009.
Added by: Axel Rennoch 05 Apr 2013 23:19:13 Europe/Berlin
D. Vega, I. Schieferdecker, and G. Din, "Test Data Variance as a Test Quality Measure: Exemplified for TTCN-3," in
Proc. Testing of Communication Systems (Testcom/Fates/Forte)
, ser. Lecture Notes in Computer Science, vol. 4581/2007, Tallinn (Estonia), June 26-29, 2007, pp. 351–364.
Added by: Deleted user 02 Apr 2009 13:48:49 Europe/Berlin
D. Vega, G. Din, and C. Rentea, "Towards Quality Evaluation of TTCN-3 Tests," ETSI TTCN-3 User Conference
: Berlin (Germany), May 31-June 2, 2006.
Last edited by: Deleted user 13 Aug 2008 14:20:18 Europe/Berlin
D. Vega, "TTCN-3 data analyzer using constraint programming," ETSI TTCN-3 User Conference
: Madrid (Spain), June 3-6, 2008.
Added by: Deleted user 20 Aug 2008 15:13:03 Europe/Berlin
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