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J. Wu, L. Xu, and C. Liu, "Develop a Reliability Test in TTCN-3," ETSI TTCN-3 User Conference
: Stockholm (Sweden), May 29-June 1, 2007.
Last edited by: Deleted user 20 Aug 2008 12:19:56 Europe/Berlin
J. Wu, L. Xu, and C. Liu, "Test Design Recovery through Reverse Engineering," ETSI TTCN-3 User Conference
Asia: Tutorial at the TTCN-3 User Confernce 2007, Beijing (China), Oct. 29-30, 2007.
Last edited by: Deleted user 15 Oct 2008 14:56:44 Europe/Berlin
L. Xu, J. Wu, and C. Liu, "The Intelligent Fuzzing in TTCN-3," ETSI TTCN-3 User Conference
Asia: Beijing (China), Oct. 29-30, 2007.
Last edited by: Deleted user 13 Aug 2008 15:00:35 Europe/Berlin
5.2.1 ©2017 | Total resources: 348 | Username: -- | Bibliography: WIKINDX Master Bibliography | Style: Institute of Electrical and Electronics Engineers (IEEE) | Database queries: 25 | DB execution: 0.01096 secs | Script execution: 0.01721 secs