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X. Chen, K. Bi, and J. Wu, "Test System Modelling and TTCN-3 Code Generation," ETSI TTCN-3 User Conference
Added by: Axel Rennoch 25 Dec 2012 23:48:22 Europe/Berlin
J. Wu, L. Xu, and C. Liu, "Develop a Reliability Test in TTCN-3," ETSI TTCN-3 User Conference
: Stockholm (Sweden), May 29-June 1, 2007.
Last edited by: Deleted user 20 Aug 2008 12:19:56 Europe/Berlin
J. Wu, "Grammar Directed TTCN-3 CD Program Synthesis," ETSI TTCN-3 User Conference
Added by: Axel Rennoch 05 Apr 2013 21:36:43 Europe/Berlin
J. Wu, "Scenario Care Load Testing in TTCN-3," ETSI TTCN-3 User Conference
: Sophia Antipolis (France), June 3-5, 2009.
Added by: Axel Rennoch 05 Apr 2013 23:46:54 Europe/Berlin
J. Wu, L. Xu, and C. Liu, "Test Design Recovery through Reverse Engineering," ETSI TTCN-3 User Conference
Asia: Tutorial at the TTCN-3 User Confernce 2007, Beijing (China), Oct. 29-30, 2007.
Last edited by: Deleted user 15 Oct 2008 14:56:44 Europe/Berlin
L. Xu, J. Wu, and C. Liu, "The Intelligent Fuzzing in TTCN-3," ETSI TTCN-3 User Conference
Asia: Beijing (China), Oct. 29-30, 2007.
Last edited by: Deleted user 13 Aug 2008 15:00:35 Europe/Berlin
5.2.1 ©2017 | Total resources: 348 | Username: -- | Bibliography: WIKINDX Master Bibliography | Style: Institute of Electrical and Electronics Engineers (IEEE) | Database queries: 25 | DB execution: 0.01129 secs | Script execution: 0.01781 secs