TTCN-3 Bibliography

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Vouffo-Feudjio, A., & Schieferdecker, I. 2007, May 29–June 1, Pattern-based development of TTCN-3 test suites. Unpublished paper presented at ETSI TTCN-3 User Conference 2007, Stockholm (Sweden). 
Added by: Deleted user (8/1/08, 2:28 PM)   Last edited by: Deleted user (8/20/08, 11:57 AM)
Resource type: Conference Paper
BibTeX citation key: VouffoFeudjioa
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Categories: General
Creators: Schieferdecker, Vouffo-Feudjio
Publisher: Ericsson, ETSI (Stockholm (Sweden))
Collection: ETSI TTCN-3 User Conference 2007
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The introduction of open and standardized service delivery platforms (SDPs) is considered as a key element towards the convergence of IT and Telecoms. The fact that such SDPs
consist in numerous APIs with each of those featuring concurrent behaviour and communication between several different software or network components pauses a serious challenge for applying black-box testing approaches to them.
However black-box testing is actually the only alternative, because vendors would not provide open access to their implementations (components) beyond the strict minimum
required by the standard specifications. Conformance testing is essential for SDPs to ensure that a minimum set of requirements is met by each implementation to ease interoperability.
We will discuss a test-pattern-based approach to effectively achieve such black-box tests without having to implement costly clones of systems under test (SUT)’s components. The Testing and Test Control Notation TTCN-3 is the only standardized notation for black-box testing. While it has been widely accepted as an appropriate and elegant mean for defining test data and test behaviour for conformance testing of telecommunication protocols, its use for testing SDPs is a rather recent field of research. We apply our test-pattern approach to a case study in which a pattern-driven test generation approach was used to
provide a framework for quickly defining and executing conformance tests for the OSA Parlay framework. The applicability of our findings for other SDPs is also discussed.
This presentation discusses main concepts of test patterns, provides a characterization of test patterns and describes the use of test patterns in the test development process.
It will demonstrate the OSA Parlay case study and the developed Eclipse plugin for pattern-based test development.
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