TTCN-3 Bibliography

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Ogawa, H., & Eichler, H. 2005, June 6–8, MDA based approach for generation of TTCN-3 test specifications. Unpublished paper presented at ETSI TTCN-3 User Conference 2005, Sophia Antipolis (France). 
Added by: Deleted user (7/25/08, 2:55 PM)   Last edited by: Deleted user (8/13/08, 2:13 PM)
Resource type: Conference Paper
BibTeX citation key: Ogawaa
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Categories: General
Creators: Eichler, Ogawa
Publisher: ETSI (Sophia Antipolis (France))
Collection: ETSI TTCN-3 User Conference 2005
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With the more and more importance of MDA for software development, the need for integration of testing into the model-based development process becomes essential, since it reduces the amount of hand written code, ensures consistency and traceability on different abstraction levels. Following the MDA approach of distinguishing between platform independent (PIM) and platform specific system modeling (PSM), test artefacts can be generated also on platform specific and platform independent level trough model-based transformation out of PIMs and PSMs . This integrates testing seamless in the model-driven software development process. Aligning this approach to the V resp. W process model shows the benefits for developers (both software and test) in the whole development process. Further this paper points out the aspects of research in the direction of requirements analysis and acceptance criteria on testing.
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