TTCN-3 Bibliography

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Gaudin, E. 2014, September 16–18, Automatic test generation based on functional coverage. Unpublished paper presented at ETSI User Conference on Advanced Automated Testing (2014), Munich, Germany. 
Added by: Axel Rennoch (19/09/2014, 11:54)   
Resource type: Conference Paper
Peer reviewed
BibTeX citation key: Gaudin2014
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 Categories: General
Keywords: Functional Testing, MSC, SDL, test automation, test generation, TTCN-3
Creators: Gaudin
Publisher: ETSI; organized by qualityminds and germantestingday (Munich, Germany)
Collection: ETSI User Conference on Advanced Automated Testing (2014)		 Views: 22/1777
WIKINDX 6.7.0 | Total resources: 347 | Username: -- | Bibliography: WIKINDX Master Bibliography | Style: American Psychological Association (APA)