TTCN-3 Bibliography

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E. Gaudin, "Automatic test generation based on functional coverage," ETSI User Conference on Advanced Automated Testing (2014): Munich, Germany, Sept. 16-18, 2014. 
Added by: Axel Rennoch (19 Sep 2014 11:54:30 Europe/Berlin)   
Resource type: Conference Paper
Peer reviewed
BibTeX citation key: Gaudin2014
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Categories: General
Keywords: Functional Testing, MSC, SDL, test automation, test generation, TTCN-3
Creators: Gaudin
Publisher: ETSI; organized by qualityminds and germantestingday (Munich, Germany)
Collection: ETSI User Conference on Advanced Automated Testing (2014)
Views: 4/2102
Views index: %
Popularity index: 5%
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