Ham, J. 2008, June 3–6, TTCN-3 technology as a candidate of unified test platform. Unpublished paper presented at ETSI TTCN-3 User Conference 2008, Madrid (Spain).
Added by: Deleted user (8/22/08, 10:37 AM)
|Resource type: Conference Paper
BibTeX citation key: Ham
View all bibliographic details
Publisher: MTP, ETSI (Madrid (Spain))
Collection: ETSI TTCN-3 User Conference 2008
Samsung Electronics produces various kinds of electronic devices such as memories, mobile phones, digital TVs, printers, mp3 players, notebooks, network devices and home appliances and so on. According as software is getting more complex and the size is growing faster, the development efforts become a burden. Therefore we recognize the need of improvement of software testing.
We used various kinds of test systems including test automation environments and test script languages for each product or organization. We feel potential benefits with reusing test systems across product-line or organization by harmonizing our test system.
We have looked for appropriate technologies as a unified test solution and we consider TTCN-3 is a good solution for us. We have evaluated TTCN-3 technology for its suitability against software developed in our company. We selected two pilot projects, one is a remote management system based on web service and the other is digital TV software. We applied both message-based and procedure-based communication mechanisms considering test environment and test purpose; procedure-based communication on unit test and message-based tests on system test for remote management system, and procedure-based
communication for API(Application Programming Interface) test of digital TV software.
We conclude that TTCN-3 technology is suitable for system test without relation to the communication mechanism. Especially, high expression power of TTCN-3 script and well defined interfaces between test executable layer and adaptation layer give us benefits compared to our existing test system. On the other hand, we have a conclusion that TTCN-3 technology is heavy on unit test where test system and SUT (System Under Test) are on the same hardware. Moreover, writing test cases with TTCN-3 script is not easy because of defining complex data structures. In this presentation, we talk about our experience and conclusion for TTCN-3 deployment to our company and future plan.
Added by: Deleted user