TTCN-3 Bibliography |
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| Resource type: Journal Article Published DOI: 10.1007/s10009-008-0077-y BibTeX citation key: Botteck2008a View all bibliographic details |
Categories: General Creators: Botteck, Deiß Collection: Software Tools for Technology Transfer (STTT) <strong>2008</strong> |
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| Abstract |
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Following the successful standardisation of TTCN-3, several attempts were made to introduce the language into the product development process to improve the related testing activities. For several years appreciation was moderate. Reasons are to be found in the structure of existing testing procedures and problems of interoperability in early TTCN-3 products. Testing and development environments typical for electronic devices manufacturing are outlined and it is shown where in the process future benefits through further formalisation of test definition and implementations may be found.
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