TTCN-3 Bibliography

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C. Brandauer,, G. Panholzer, and S. Pietsch, "Towards formalized test specifications for IEC 61850," in Proc. Sixth Protection, Automation and Control (PAC) World Conference, June 29-July 2, 2015, 
Added by: Axel Rennoch (14 Jul 2015 11:09:02 Europe/Berlin)   
Resource type: Proceedings Article
Peer reviewed
BibTeX citation key: Brandauer2015
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Categories: General
Keywords: Conformance Testing, Functional Testing, TTCN-3, UML
Creators: Brandauer,, Panholzer, Pietsch
Collection: Sixth Protection, Automation and Control (PAC) World Conference
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   URLs   http://www.testingtech.com/download/publications/2015-07-Formalized-Test-Specifications-for-IEC_61850.pdf
Abstract
This paper is concerned with testing in the context of IEC 61850. Currently, a paper and pen method is used to create prose descriptions of test cases in a table-based template. The test cases, while still remaining on an abstract level, could be significantly enhanced by adding more detail and making use of a (more) formal specification language. To this end we have studied other approaches to (conformance) testing, in particular TTCN-3 which is an open, standardized testing technology. In the paper it is demonstrated how existing UCAIug client tests are mapped to abstract TTCN-3 test cases. With the addition of SUT-specific adapters these test cases are then executed against a commercial IEC 61850 client implementation. Finally, we contrast this approach with an UML-based test development methodology.
  
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