TTCN-3 Bibliography

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E. Gaudin, "Automatic test generation based on functional coverage," ETSI User Conference on Advanced Automated Testing (2014): Munich, Germany, Sept. 16-18, 2014.  
Added by: Axel Rennoch 19 Sep 2014 11:54:30 Europe/Berlin
wikindx 5.2.1 ©2017 | Total resources: 340 | Username: -- | Bibliography: WIKINDX Master Bibliography | Style: Institute of Electrical and Electronics Engineers (IEEE) | Database queries: 25 | DB execution: 0.00858 secs | Script execution: 0.02197 secs