TTCN-3 Bibliography

Browse Publishers

IEEE Seventh International Conference on Software Testing, Verification and Validation (ICST) (Cleveland, OH, USA) [1]  University of Amsterdam (Amsterdam) [1]  Wiley & Sons [1]  wordpress.com [1]

Displaying 1 - 4 of 4


wikindx 5.2.1 ©2017 | Total resources: 339 | Username: -- | Bibliography: WIKINDX Master Bibliography | Style: Institute of Electrical and Electronics Engineers (IEEE) | Database queries: 17 | DB execution: 0.01618 secs | Script execution: 0.04926 secs